Fp2 software

Complete XRF analysis is possible, with or without standards, using an internal database of fundamental parameters FP such as absorption coefficients, fluorescence yields, transition probabilities, etc.

All versions of the software process the raw X-ray spectra collected from X-ray detectors and signal processors to obtain:. Spectrum processing libraries are available for removing spectrum artifacts escape and sum peaks , background and for various least-squares peak-fitting models synthetic Gaussian and experimental reference profiles or overlap factors.

New features include split screen mode, workflow-based software, and built-in file manager. The software can be set in either Easy or Expert modes of operation. Skip to content. Rockwell Automation Allen-Bradley Software. Schneider Software. Mitsubishi Software. Velocio Software. Modicon Software. Panasonic Software. Keyence Software. Telemecanique Software. Beckhoff Software. GE Software. Automation Direct Software. IDEC Software. Opto22 Software.

The background removal module uses iterative filtering to distinguish peaks, leaving behind the smoothly varying spectral background. This background is then removed from the original spectrum, leaving the peaks. The blank subtraction module is used to remove peaks due to environmental interference or contamination. Figure 6. Processed spectrum and background. The escape peak module uses an internal function to estimate the fraction of x-ray events above the K edge that will generate K x-rays that will escape from the front or backside of the detector.

Includes parameters for both Si and CdTe. Figure 8. Plot showing a tungsten W x-ray tube output spectrum taken with a CdTe detector after processing to remove escape events. The gray trace shows the original spectrum. The green trace illustrates the escape events in the original spectrum. These are subtracted from this original spectrum, then the correct energies are computed by adding in the energy which escaped. The blue trace shows the corrected escape events, which are then summed with the gray trace.

The dark black trace shows the final result of the processing with the events in their correct channels. This module operates on the processed spectrum to extract the net peak intensities for the selected elements.

It includes several options. First, the peak areas are computed using one of three methods: 1 simple peak integration across a fixed Region-Of-Interest, 2 fitting Gaussians to the peaks, using a known database of line ratios and peak energies, etc. Second, the spectrum fitting can be done using either a linear or nonlinear approach.

Both utilize a least-squares method. In linear fitting, the peak ratios, energies and widths are fixed. This method is usually very fast. In nonlinear fitting, these parameters are allowed to vary within certain constraints. This method is much more computationally intensive. All required line energies and resolutions are calculated automatically from the specified analyte line.

The Gaussian peak fitting can be done with a linear or nonlinear least-squares approach. The latter allows constrained changes in the peak positions, intra-series line ratios, and peak widths, from their nominal starting points. In addition to calculating elemental intensities, the software automatically calculates the estimated uncertainty and background values which allows uncertainty and Minimum Detection Limit MDL calculations to be performed during the FP analysis. Figure 9.

Plot showing spectra from a stainless steel sample. The black trace is the raw spectrum, the blue trace is the processed spectrum, and the red curves show the result of a Gaussian deconvolution. The quantitative results are in Table 1. There are two methods of spectrum acquisition. A repeat measurement capability is provided. Figure Easy and Expert Modes. Using the XRS-FP2 interface, the software analyzes a spectrum and assigns the most-likely elements and lines to each identified peak, and assembles a complete list of likely elements in the spectrum.

FP calibrations using multiple type standards and various additional regression models used to refine the FP calibration coefficients. Up to 8 spectra can be compared. KLM markers are available for peak identification and various annotation tools are available for adding text and lines to the display.

Spectrum display showing element markers. By continuing to use the site you agree to our privacy and cookie policy. Features Fundamental parameters FP Analysis with or without standards General bulk and thin-film analysis Real-time analysis of up to 55 elements Automatic element identification Integrated spectrum display with split screen mode Built-in file manager Supports all Amptek detectors Si-PIN, SDD, CdTe , X-ray tubes, and electronics Batch analysis mode for continuous or repeated analysis CdTe escape peak correction Non-destructive analysis.

Figure 1. Up to 55 elements can be analyzed at a time. Please sign in now or Register using the Register Now! Enclose exact words or phrases in double quotes. The more exact the phrases are to the actual title or string of text in a document, the better the results. Videos and Tips on using the Avaya Support Website can be found here. Use the Support by Product short-cut at the top of each page, and select your product and release to find the latest Product and Support Notices, the latest and top documentation, latest downloads, and the Top Solutions that agents are using to close customer tickets.